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1

Single contact beam induced current phenomenon for microelectronic failure analysis

JCH Phang, DSH Chan, VKS Ong, S Kolachina, JM Chin, M Palaniappan, G Gilfeather, YX Seah

Journal:

Microelectronics Reliability

Year:

2003

File:

PDF, 1.37 MB

2003

2

[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - DC-Coupled Laser Induced Detection System for Fault Localization in Microelectronic Failure Analysis

Quah, Act, Koh, Ls, Chua, Cm, Palaniappan, M, Chin, Jm, Phang, Jch

Year:

2006

Language:

english

File:

PDF, 3.93 MB

english, 2006

3

Investigation of capacitive coupling voltage contrast using a specimen charging model

KS Sim, DSH Chan, JCH Phang

Journal:

Microelectronic Engineering

Year:

1994

Language:

english

File:

PDF, 640 KB

english, 1994

4

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Determination of Intrinsic Spectra from Frontside & Backside Photon Emission Spectroscopy

Tan, SL, Toh, KH, Chan, DSH, Phang, JCH, Chua, CM, Koh, LS

Year:

2007

Language:

english

File:

PDF, 2.18 MB

english, 2007

5

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Determination of the local electric field strength by Energy dispersive Photon Emission Microscopy

Geinzer, T, Heiderhoff, R, Phang, JCH, Balk, LJ

Year:

2010

Language:

english

File:

PDF, 1.16 MB

english, 2010